Ke kūkulu ʻia nei ka ʻōnaehana M2 CT nui loa o ʻEulopa

Loaʻa ka hapa nui o ka Industrial CTHoʻokumu Granite.Hiki iā mākou ke hanahui kumu mīkini granite me nā kaʻa a me nā wilino kāu X RAY a me CT.

Ua lanakila ʻo Optotom a me Nikon Metrology i ka makana no ka hāʻawi ʻana i kahi ʻōnaehana X-ray Computed Tomography nui i Kielce University of Technology ma Polani.ʻO ka ʻōnaehana Nikon M2 he ʻōnaehana hoʻohālikelike kiʻekiʻe, modular inspection system e hōʻike ana i kahi manipulator 8-axis patented, ultra-precise a paʻa i kūkulu ʻia ma luna o kahi kumu pōhaku metrology-grade.

Ma muli o ka palapala noi, hiki i ka mea hoʻohana ke koho ma waena o 3 mau kumu like ʻole: ʻO Nikon kahi 450 kV microfocus kumu me ka huli ʻana i ka pahuhopu e nānā i nā laʻana nui a kiʻekiʻe me ka micrometer hoʻonā, kahi kumu minifocus 450 kV no ka nānā kiʻekiʻe a me kahi microfocus 225 kV. kumu me ka pahu hopu no nā laʻana liʻiliʻi.E hoʻolako ʻia ka ʻōnaehana me ka mea ʻike papa pālahalaha a me ka Nikon proprietary Curved Linear Diode Array (CLDA) detector e hoʻopaʻa pono i ka hōʻiliʻili ʻana o nā kukui X me ka ʻole o ka hopu ʻana i nā kukui i hoʻopuehu ʻole ʻia, e hopena i ka oi a me ka ʻokoʻa o ke kiʻi.

He kūpono ka M2 no ka nānā ʻana i nā ʻāpana mai ka liʻiliʻi liʻiliʻi liʻiliʻi i nā mea nui, kiʻekiʻe.E hana ʻia ka hoʻonohonoho ʻana o ka ʻōnaehana i kahi bunker kūikawā.Ua mākaukau mua nā pā 1,2 m no ka hoʻonui ʻana i ka wā e hiki mai ana i nā pae ikehu kiʻekiʻe.ʻO kēia ʻōnaehana koho piha ʻo ia kekahi o nā ʻōnaehana M2 nui loa ma ka honua, e hāʻawi ana i ka maʻalahi o ke Kulanui ʻo Kielce e kākoʻo i nā noi āpau mai ka noiʻi a me ka ʻoihana kūloko.