Ka Mana Lima-Lapping a me ka Laser Metrology: Hoʻokō ʻana i ka Nanometer Flatness ma ka Mass Production

He mea kupanaha nā mīkini wili mana helu kamepiula (CNC) o kēia au o ka automation ʻoihana. Hiki i nā lako wili nui, e like me nā wili ʻili kaumaha 6000 mm, ke hana wikiwiki i nā kahua metala a me nā mea ʻole metala i nā ʻae paʻa. Eia nō naʻe, ke koi ka kikoʻī i ka pālahalaha nanometer ma luna o nā ʻāpana nui, hiki i ka mīkini mechanical i kona mau palena kino.

ʻO ka hoʻomaʻemaʻe hope loa o nā ʻāpana granite precision, nā papa ʻili, a me nā kihi pololei e pono ai ka hui pū ʻana o ka manaʻo sensory kanaka a me ka laser interferometry.

Nā Palena o ka Wili Mechanical

ʻOiai ka mea holomua loaNā mīkini wili CNCloaʻa nā hewa mechanical kūlohelohe. ʻO ka holo ʻana o ka spindle, ka deflection structural o ka gantry mīkini, a me nā loli wela microscopic i loko o ka coolant ke kumu o nā ʻano nalu cyclical ma ka workpiece honua. Pale kēia mau hōʻailona mechanical i nā mīkini maʻamau mai ka uhaki ʻana i ka pale sub-micron ma nā ʻāpana nui.

 

No ka hoʻokō ʻana i kahi ʻikepili nanometer maoli, pono e hana ka ʻāpana i ka hoʻoponopono lima kūikawā, kahi hana i ʻike ʻia ʻo ka hand-lapping.

Ke Kaʻina Hana Lima-Lap: Manaʻo Hoʻopili Palekana Micro-Level

ʻO ka hoʻopaʻa lima ʻana he hana noʻeau mīkini kūikawā kahi e hoʻohana ai nā loea akamai i nā hui abrasive a me nā poloka hoʻopaʻa maʻamau e wehe koho i nā mea mai nā wahi kiʻekiʻe ma kaʻili granite.

• ʻO ka pololei o ka ʻike paʻa: Loaʻa i nā loea akamai ka ʻike paʻa i hoʻomohala ʻia i nā makahiki he ʻumi o ka ʻike lima. Hiki iā lākou ke ʻike i nā ʻokoʻa o ka ʻili a hiki i nā micrometers hoʻokahi-helu ma ka manaʻo ʻana i ke kū'ē a me ka friction o ka poloka lapping.

• Hoʻoponopono Hou ʻia: He hana hou wale nō ke kaʻina hana. Hoʻopuni ka loea i ka ʻili, ʻae i ka mea e hoʻopaʻa i ka wela, ana i ke ʻano o ka ʻāina me nā mea hana metrology uila, a hana hou i ke kaʻina hana a hiki i ka loaʻa ʻana o ka pālahalaha i makemake ʻia.

• ʻO ka pālahalaha Nanometer: Ma o kēia ʻano hana lima, ua hoʻemi mālie ʻia nā wahi kiʻekiʻe, e ʻae ana i nā papa ʻili granite nui e hoʻokō i nā ʻano ʻili a hiki i nā palena nanometer—ʻaʻole hiki ke hoʻokō ʻia e nā huila wili aunoa wale nō.

Ke hōʻoia nei i ka pololei ma o ka Metrology Kiʻekiʻe a me ka Traceability

ʻAʻole kūpono ka mākaukau lima me ka ʻole o ka hōʻoia pono ʻana o ke ana ʻana. No ka hōʻoia ʻana i nā ʻili i hoʻopaʻa lima ʻia, hoʻohana nā hale hana hana i nā lako metrology holomua i hoʻoponopono ʻia e nā kūlana honua.

• ʻO ka Laser Interferometry: Hoʻohana ʻia nā ʻōnaehana e like me ka Renishaw laser Interferometer e palapala i nā hewa linear, angular, a me ka flatness o nā ala alakaʻi a me nā kaola kūkulu ma nā mamao lōʻihi (a hiki i 20 m).

• Ka Paepae Uila ʻokoʻa: Hoʻohana ʻia nā pae uila WYLER Swiss ma nā hui ʻokoʻa e hopu i ka pitch angular a me nā ʻōwili i lalo a i 0.5μm.

• Nānā ʻana i ka Micro-Topography: ʻO nā ʻōkuhi dial Mahr (hoʻonā 0.5μm), nā calipers kikohoʻe Mitutoyo, a me nā mea hoʻāʻo ʻili kiʻekiʻe e hōʻoia i ka kūlike o ka micro-texture o ka granite me nā kikoʻī o ka lumi maʻemaʻe.

Ka Pono o ka Lahui Calibration Traceability

He kūpono wale nō ke ana ʻana inā hiki ke hōʻoia ʻia e kahi ʻaoʻao ʻekolu kūʻokoʻa. Pono nā mea hana metrology kiʻekiʻe a pau e paʻa i nā palapala hōʻoia calibration kūpono i hoʻopuka ʻia e nā ʻoihana ʻāpana i ʻae ʻia, e like me ka Shandong Institute of Metrology a i ʻole ka Jinan Institute of Metrology.

ʻO ke koʻikoʻi, pono i kēlā me kēia kūlana kuhikuhi i hoʻohana ʻia ma ka hale hana ke hōʻike i kahi kaulahao i haki ʻole ʻia o ka hiki ke hahai ʻia i ka National Institute of Metrology (NIM). Hōʻoia kēia i ka wā e nānā ai kahi ʻenekinia kūʻai mai Apple, Samsung, a i ʻole Bosch i ka hōʻike nānā o kahi ʻāpana granite ZHHIMG®, kūpono ka ʻikepili ma lalo o nā ʻaelike metrology honua.